The test probe is a developmental electronic component that manages the testing of signals and quality issues of electronic control circuits, which can pick up signals without any loss and then provide them to the corresponding test data system for research and analysis.
Current control signals can be through the network tester cable bundle flow to the probe casing, through the probe needle for transmission to the point to be tested, after reaching the device under test, and then along the original path back to the system test and analysis instruments.
The working principle of the test probes is to transmit current signals through the probes to test the open and short circuit parameters of the circuit board, the test system will transmit the current input to the device under test, and measure the response of the device to the input signal.
Probe has different structures and application areas, can be divided into shrapnel probe, cantilever probe and vertical probe, can be divided into semiconductor test probes, high-frequency test probes, RF test probes, high-current test probes, traditional ICT probes and so on.
This article will mainly introduce the test probes in the high frequency test probes, radio frequency test probes, high current test probes have what role.
High Frequency Test Probes
High-frequency system test probes small impedance, loss-resistant, wafer testis a pcb board, high-speed development of digital control circuit boards, wafers, microwave chips, one of the indispensable test and analysis tools and methods of technical testing.
High-frequency test probes have a variety of head types to choose from, according to customer requirements to set the length of high-frequency wire and different wire type; the lowest frequency can reach 2.4GHz, attenuation -1.5db, in the test of laptop computers, wireless network cards, bluetooth has a very good performance; can meet a variety of testing needs, reliable connection, easy to use.
RF Test Probe
This RF test probe is made of beryllium copper with excellent conductivity, wafer level testinglong term stabilization in the contact position, so it has good durability and plays an important role in testing micro switches, plug connectors and circuit boards.
RF test probes are essential for technology development, parameter extraction, performance debugging and production testing of RF products. Using RF test probes allows you to measure the characteristics of RF modules through chip levels, reducing test time and development costs.
High Current Test Probes
This high current test probe has a large test current and is capable of passing high temperature high current tests. High current probes are required in many industries that use high current and high current probes. They are widely used for a variety of functional tests, signaling, production testing and as built-in shock elements, high current test probes have very low internal resistance requirements. For example, BTB/FPC connectors can transmit high currents while maintaining a stable connection during testing.
The intrinsic factors of high current test probes, such as the area of the probe core, the conductivity of the material, and the conductivity of the insulation, determine the amount of current carried by the probe. The thicker the probe core,failure analysis the higher the purity of the copper in the conductive material, and the better the thermal conductivity of the insulating material, the higher the conductivity of the high current test probe and the higher the current carrying capacity.